Koh Young

KY-8030 Series


  • The new KY8030-2 and KY8030-3 deliver 3x faster inspection without compromising performance and accuracy.
  • Using patented dual projection, these systems eliminate the critical Shadow problem that all 3D SPI systems can be vulnerable to.
  • Additionally, the new KY8030-2 and KY8030-3 have solved the PCB warp problem that seriously impacts inspection accuracy and reliability of results.

download KY-8030 Series datasheet

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